As the sole distributor for Trimos products in the UK, Camberley-based
Bowers Group has introduced the new Tr-Scan 2D. The first in the series of TR-Scan products from Trimos, this completely CNC controlled system offers customers a fresh and simple approach to contactless measurement with a large vertical measurement range.
Bowers Group sales director Martin Hawkins said: “We are delighted to be able to introduce the Trimos Tr-Scan 2D to the UK. Trimos has cleverly adopted a fresh perspective for contactless surface measurement with ths device.
“Its stable mechanism enables contactless measurements down to a few µm, and the simple optical coupling system allows for fast changes in measuring range.
“Add in a wide range of sensors and the Tr- Scan 2D is versatile enough to satisfy a variety of measurement needs, and simple enough for multiple operators.”
Driven by Nanoware measurement software, the system allows any type of 2-D mode measurement, and the integration of “vertical patching” (stitching) enables it to comfortably exceed the measuring range of the sensor.
Macros can be created in the software to enable an entirely automatic measurement with integration to component pallets from a production line environment.
The software analysis program can produce log sheets that are used in accordance with current roughness standards, such as Ra, Rz, Rq etc. It is also possible to transform the profile into a contour analysis by using the contour option.
Trimos has been a leader in the field of dimensional metrology since 1972, guaranteeing ‘Swiss-made’ quality. The company offers a range of solutions that respond to dimensional measurement needs, combining high precision, innovation, advanced design and ease-of-use.
As sole UK agent, Bowers can exclusively offer its customers the full range of Trimos height gauges, horizontal measuring instruments and surface analysis instruments, along with the new Trimos Tr-Scan 2D.
To find out more, or to receive a demonstration, contact the Bowers Group on 01276 469 866, or email: .