Nikon Corporation (Nikon) has launched the ECLIPSE LV100AMS, a new one‑click automated microscope designed to simplify industrial inspection and quality control. Built on Nikon’s established industrial microscope platforms, the LV100AMS combines fully automated inspection with AI‑powered image analysis, enabling manufacturers to improve consistency, increase inspection speed and strengthen confidence in inspection outcomes.
Manufacturers today face growing challenges such as labour shortages and increasing throughput demands, both of which make it more difficult to maintain consistent inspection quality. To address these issues, Nikon developed the LV100AMS to automate the entire inspection workflow, from image acquisition through to analysis.
John Moore, sales director at Nikon, said: “We enable manufacturers to reduce human error, accelerate inspections, and maintain stable quality across production lines.”
The LV100AMS is now fully integrated into Nikon’s industrial microscopy portfolio, providing a complete and reliable automated inspection solution.
One of the system’s core advantages is its one‑click automated inspection capability. Manual inspection processes are often highly dependent on operator skill and consistency, making it challenging to maintain stable quality at scale. With the LV100AMS, even complex inspection routines and advanced image analysis can be executed automatically with a single click. This removes variation between operators, reduces human error and enables repeatable, standardised inspections across shifts and sites. In turn, manufacturers can improve yield, reduce rework rates and minimise training requirements.
The system also brings together motorisation, automated imaging and AI‑driven analysis into a single integrated solution. Traditional inspection workflows can be slowed down by disconnected steps and manual interpretation, which introduce variability and inefficiencies. By combining these elements seamlessly, the LV100AMS delivers consistent and objective results with minimal operator influence. This integration increases throughput, supports scalable inspection processes and provides greater confidence in quality control decisions.
Another key strength of the LV100AMS is its flexibility through customisable automated workflows. Since production lines and inspection requirements vary widely, rigid systems can limit optimisation. The LV100AMS allows manufacturers to create tailored inspection workflows that match their specific products, processes and conditions. This adaptability enables inspection approaches that go beyond the capabilities of conventional microscopy and allows manufacturers to respond more quickly to new products, design changes and evolving quality standards.
Nikon Metrology Europe has also announced an upcoming webinar on 25 June to introduce the new ECLIPSE LV100AMS system, with a particular focus on grain size analysis as one of its key applications. During the session, Merten Kuna, application engineer in the Microscopy Business Unit Europe, will demonstrate the system’s fully automated inspection capabilities. Powered by advanced AI‑driven image analysis, the LV100AMS enables manufacturers to enhance consistency, increase inspection speed and gain greater confidence in their inspection results.
To register for the webinar visit:
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